Frégnaux, M., Khelifi, R., Muller, D., & Mathiot, D. (2014). Optical characterizations of doped silicon nanocrystals grown by co-implantation of Si and dopants in SiO2. Journal of Applied Physics, 116(14), 1. https://doi.org/10.1063/1.4898038
Chicago Style (17th ed.) CitationFrégnaux, M., R. Khelifi, D. Muller, and D. Mathiot. "Optical Characterizations of Doped Silicon Nanocrystals Grown by Co-implantation of Si and Dopants in SiO2." Journal of Applied Physics 116, no. 14 (2014): 1. https://doi.org/10.1063/1.4898038.
MLA (9th ed.) CitationFrégnaux, M., et al. "Optical Characterizations of Doped Silicon Nanocrystals Grown by Co-implantation of Si and Dopants in SiO2." Journal of Applied Physics, vol. 116, no. 14, 2014, p. 1, https://doi.org/10.1063/1.4898038.