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Teflon/SiO2 Bilayer Passivation for Improving the Electrical Reliability of Oxide TFTs Fabricated Using a New Two-Photomask Self-Alignment Process.

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Title: Teflon/SiO2 Bilayer Passivation for Improving the Electrical Reliability of Oxide TFTs Fabricated Using a New Two-Photomask Self-Alignment Process.
Authors: Ching-Lin Fan1,2 clfan@mail.ntust.edu.tw, Ming-Chi Shang1 d10019004@mail.ntust.edu.tw, Bo-Jyun Li1 m10019004@mail.ntust.edu.tw, Yu-Zuo Lin2 yzlin.ntust@gmail.com, Shea-Jue Wang3 sjwang@ntut.edu.tw, Win-Der Lee4 leewd@mail.lit.edu.tw, Bohr-Ran Hung1 huangbr@mail.ntust.edu.tw
Source: Materials (1996-1944). 2015, Vol. 8 Issue 4, p1704-1713. 10p. 2 Diagrams, 1 Chart, 4 Graphs.
Database: Academic Search Ultimate
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  Data: Teflon/SiO<subscript>2</subscript> Bilayer Passivation for Improving the Electrical Reliability of Oxide TFTs Fabricated Using a New Two-Photomask Self-Alignment Process.
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  Data: <searchLink fieldCode="AR" term="%22Ching-Lin+Fan%22">Ching-Lin Fan</searchLink><relatesTo>1,2</relatesTo><i> clfan@mail.ntust.edu.tw</i><br /><searchLink fieldCode="AR" term="%22Ming-Chi+Shang%22">Ming-Chi Shang</searchLink><relatesTo>1</relatesTo><i> d10019004@mail.ntust.edu.tw</i><br /><searchLink fieldCode="AR" term="%22Bo-Jyun+Li%22">Bo-Jyun Li</searchLink><relatesTo>1</relatesTo><i> m10019004@mail.ntust.edu.tw</i><br /><searchLink fieldCode="AR" term="%22Yu-Zuo+Lin%22">Yu-Zuo Lin</searchLink><relatesTo>2</relatesTo><i> yzlin.ntust@gmail.com</i><br /><searchLink fieldCode="AR" term="%22Shea-Jue+Wang%22">Shea-Jue Wang</searchLink><relatesTo>3</relatesTo><i> sjwang@ntut.edu.tw</i><br /><searchLink fieldCode="AR" term="%22Win-Der+Lee%22">Win-Der Lee</searchLink><relatesTo>4</relatesTo><i> leewd@mail.lit.edu.tw</i><br /><searchLink fieldCode="AR" term="%22Bohr-Ran+Hung%22">Bohr-Ran Hung</searchLink><relatesTo>1</relatesTo><i> huangbr@mail.ntust.edu.tw</i>
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  Data: <searchLink fieldCode="JN" term="%22Materials+%281996-1944%29%22">Materials (1996-1944)</searchLink>. 2015, Vol. 8 Issue 4, p1704-1713. 10p. 2 Diagrams, 1 Chart, 4 Graphs.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=102298788
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        Text: English
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      – TitleFull: Teflon/SiO2 Bilayer Passivation for Improving the Electrical Reliability of Oxide TFTs Fabricated Using a New Two-Photomask Self-Alignment Process.
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