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A new approach to numerical analysis of reliability indices in electronics.

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Bibliographic Details
Title: A new approach to numerical analysis of reliability indices in electronics.
Authors: Geniy, Kuznetsov1, Evgen, Kravchenko1 kevatp@tpu.ru
Source: EPJ Web of Conferences. 2015, Vol. 82, p1-6. 6p.
Database: Academic Search Ultimate
Description
ISSN:21016275
DOI:10.1051/epjconf/20158201029