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A new approach to numerical analysis of reliability indices in electronics.

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Title: A new approach to numerical analysis of reliability indices in electronics.
Authors: Geniy, Kuznetsov1, Evgen, Kravchenko1 kevatp@tpu.ru
Source: EPJ Web of Conferences. 2015, Vol. 82, p1-6. 6p.
Database: Academic Search Ultimate
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An: 103564083
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PubType: Conference
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  Data: <searchLink fieldCode="AR" term="%22Geniy%2C+Kuznetsov%22">Geniy, Kuznetsov</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Evgen%2C+Kravchenko%22">Evgen, Kravchenko</searchLink><relatesTo>1</relatesTo><i> kevatp@tpu.ru</i>
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  Data: <searchLink fieldCode="JN" term="%22EPJ+Web+of+Conferences%22">EPJ Web of Conferences</searchLink>. 2015, Vol. 82, p1-6. 6p.
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        Value: 10.1051/epjconf/20158201029
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              Text: 2015
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