Ferroelectric and dielectric study of strontium tantalum based perovskite oxynitride films deposited by reactive rf magnetron sputtering. - Le Paven, C.; Benzerga, R.; Ferri, A.; Fasquelle, D.; Laur, V.; Le Gendre, L.; Marlec, F.; Tessier, F.; Cheviré, F.; Desfeux, R.; Saitzek, S.; Castel, X.; et al. (Materials Research Bulletin, 2017)