Floating Gate EPROM Instability for True Randomness Generation.

Saved in:
Bibliographic Details
Title: Floating Gate EPROM Instability for True Randomness Generation.
Authors: Genoff, Jordan Genoff1 jgenoff@tu-plovdiv.bg
Source: Annual Journal of Electronics. 2014, Vol. 8, p124-127. 4p.
Database: Academic Search Ultimate
FullText Links:
  – Type: pdflink
Text:
  Availability: 0
Header DbId: asn
DbLabel: Academic Search Ultimate
An: 131038653
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Floating Gate EPROM Instability for True Randomness Generation.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Genoff%2C+Jordan+Genoff%22">Genoff, Jordan Genoff</searchLink><relatesTo>1</relatesTo><i> jgenoff@tu-plovdiv.bg</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Annual+Journal+of+Electronics%22">Annual Journal of Electronics</searchLink>. 2014, Vol. 8, p124-127. 4p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=131038653
RecordInfo BibRecord:
  BibEntity:
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 4
        StartPage: 124
    Titles:
      – TitleFull: Floating Gate EPROM Instability for True Randomness Generation.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Genoff, Jordan Genoff
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 01
              Text: 2014
              Type: published
              Y: 2014
          Identifiers:
            – Type: issn-print
              Value: 13131842
          Numbering:
            – Type: volume
              Value: 8
          Titles:
            – TitleFull: Annual Journal of Electronics
              Type: main
ResultId 1