de Vasconcelos, L. E. G., Leite, N. P. O., Kusumoto, A. Y., Roberto, L., & Lopes, C. M. A. (2019). Store Separation: Photogrammetric Solution for the Static Ejection Test. International Journal of Aerospace Engineering, 1. https://doi.org/10.1155/2019/6708450
Chicago Style (17th ed.) Citationde Vasconcelos, Luiz Eduardo Guarino, Nelson Paiva Oliveira Leite, André Yoshimi Kusumoto, Leandro Roberto, and Cristina Moniz Araujo Lopes. "Store Separation: Photogrammetric Solution for the Static Ejection Test." International Journal of Aerospace Engineering 2019: 1. https://doi.org/10.1155/2019/6708450.
MLA (9th ed.) Citationde Vasconcelos, Luiz Eduardo Guarino, et al. "Store Separation: Photogrammetric Solution for the Static Ejection Test." International Journal of Aerospace Engineering, 2019, p. 1, https://doi.org/10.1155/2019/6708450.