Raith, T., Iffelsberger, C., Vatsyayan, P., & Matysik, F. (2019). Impacts of Forced Convection Generated via High Precision Stirring on Scanning Electrochemical Microscopy Experiments in Feedback Mode. Electroanalysis, 31(2), 273. https://doi.org/10.1002/elan.201800562
Chicago Style (17th ed.) CitationRaith, Timo, Christian Iffelsberger, Preety Vatsyayan, and Frank‐Michael Matysik. "Impacts of Forced Convection Generated via High Precision Stirring on Scanning Electrochemical Microscopy Experiments in Feedback Mode." Electroanalysis 31, no. 2 (2019): 273. https://doi.org/10.1002/elan.201800562.
MLA (9th ed.) CitationRaith, Timo, et al. "Impacts of Forced Convection Generated via High Precision Stirring on Scanning Electrochemical Microscopy Experiments in Feedback Mode." Electroanalysis, vol. 31, no. 2, 2019, p. 273, https://doi.org/10.1002/elan.201800562.