APA (7th ed.) Citation

PENG, R., QU, Y., HAO, J., PAN, H., NIU, J., & JIANG, J. (2019). Multiple parametric nanoscale measurements with high sensitivity based on through‐focus scanning optical microscopy. Journal of Microscopy, 274(3), 139. https://doi.org/10.1111/jmi.12792

Chicago Style (17th ed.) Citation

PENG, R., Y. QU, J. HAO, H. PAN, J. NIU, and J. JIANG. "Multiple Parametric Nanoscale Measurements with High Sensitivity Based on Through‐focus Scanning Optical Microscopy." Journal of Microscopy 274, no. 3 (2019): 139. https://doi.org/10.1111/jmi.12792.

MLA (9th ed.) Citation

PENG, R., et al. "Multiple Parametric Nanoscale Measurements with High Sensitivity Based on Through‐focus Scanning Optical Microscopy." Journal of Microscopy, vol. 274, no. 3, 2019, p. 139, https://doi.org/10.1111/jmi.12792.