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Multiple parametric nanoscale measurements with high sensitivity based on through‐focus scanning optical microscopy.

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Bibliographic Details
Title: Multiple parametric nanoscale measurements with high sensitivity based on through‐focus scanning optical microscopy.
Authors: PENG, R.1 (AUTHOR), QU, Y.1 (AUTHOR), HAO, J.1 (AUTHOR), PAN, H.1 (AUTHOR), NIU, J.2 (AUTHOR), JIANG, J.1 (AUTHOR) jiangjie@buaa.edu.cn
Source: Journal of Microscopy. Jun2019, Vol. 274 Issue 3, p139-149. 11p. 4 Diagrams, 2 Charts, 5 Graphs.
Database: Academic Search Ultimate
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Description
ISSN:00222720
DOI:10.1111/jmi.12792