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Multiple parametric nanoscale measurements with high sensitivity based on through‐focus scanning optical microscopy.

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Title: Multiple parametric nanoscale measurements with high sensitivity based on through‐focus scanning optical microscopy.
Authors: PENG, R.1 (AUTHOR), QU, Y.1 (AUTHOR), HAO, J.1 (AUTHOR), PAN, H.1 (AUTHOR), NIU, J.2 (AUTHOR), JIANG, J.1 (AUTHOR) jiangjie@buaa.edu.cn
Source: Journal of Microscopy. Jun2019, Vol. 274 Issue 3, p139-149. 11p. 4 Diagrams, 2 Charts, 5 Graphs.
Database: Academic Search Ultimate
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  Data: Multiple parametric nanoscale measurements with high sensitivity based on through‐focus scanning optical microscopy.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Microscopy%22">Journal of Microscopy</searchLink>. Jun2019, Vol. 274 Issue 3, p139-149. 11p. 4 Diagrams, 2 Charts, 5 Graphs.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=136445794
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1111/jmi.12792
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      – Code: eng
        Text: English
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        PageCount: 11
        StartPage: 139
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      – TitleFull: Multiple parametric nanoscale measurements with high sensitivity based on through‐focus scanning optical microscopy.
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            NameFull: PENG, R.
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            NameFull: QU, Y.
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            NameFull: HAO, J.
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            NameFull: PAN, H.
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            NameFull: NIU, J.
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            – D: 01
              M: 06
              Text: Jun2019
              Type: published
              Y: 2019
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              Value: 274
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