Head-on-Pillow Defect Detection: X-Ray Inspection Limitations.

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Bibliographic Details
Title: Head-on-Pillow Defect Detection: X-Ray Inspection Limitations.
Authors: Bruno, Lars1 lars.bruno@ericsson.com, Gustafson, Benny1 benny.gustafson@ericsson.com
Source: Journal of Microelectronic & Electronic Packaging. Apr2019, Vol. 16 Issue 2, p91-102. 12p.
Database: Academic Search Ultimate
Description
ISSN:15514897
DOI:10.4071/imaps.871613