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Head-on-Pillow Defect Detection: X-Ray Inspection Limitations.

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Title: Head-on-Pillow Defect Detection: X-Ray Inspection Limitations.
Authors: Bruno, Lars1 lars.bruno@ericsson.com, Gustafson, Benny1 benny.gustafson@ericsson.com
Source: Journal of Microelectronic & Electronic Packaging. Apr2019, Vol. 16 Issue 2, p91-102. 12p.
Database: Academic Search Ultimate
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Microelectronic+%26+Electronic+Packaging%22">Journal of Microelectronic & Electronic Packaging</searchLink>. Apr2019, Vol. 16 Issue 2, p91-102. 12p.
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        Value: 10.4071/imaps.871613
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        Text: English
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      – TitleFull: Head-on-Pillow Defect Detection: X-Ray Inspection Limitations.
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              Text: Apr2019
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