Liu, Y., Zhang, Y., Tardivel, M., Lequeux, M., Chen, X., Liu, W., . . . Fu, W. (2020). Evaluation of the Reliability of Six Commercial SERS Substrates. Plasmonics, 15(3), 743. https://doi.org/10.1007/s11468-019-01084-8
Chicago Style (17th ed.) CitationLiu, Yu, et al. "Evaluation of the Reliability of Six Commercial SERS Substrates." Plasmonics 15, no. 3 (2020): 743. https://doi.org/10.1007/s11468-019-01084-8.
MLA (9th ed.) CitationLiu, Yu, et al. "Evaluation of the Reliability of Six Commercial SERS Substrates." Plasmonics, vol. 15, no. 3, 2020, p. 743, https://doi.org/10.1007/s11468-019-01084-8.
Warning: These citations may not always be 100% accurate.