Evaluation of the Reliability of Six Commercial SERS Substrates.
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| Title: | Evaluation of the Reliability of Six Commercial SERS Substrates. |
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| Authors: | Liu, Yu1 (AUTHOR), Zhang, Yang1 (AUTHOR), Tardivel, Morgan2 (AUTHOR), Lequeux, Médéric3 (AUTHOR), Chen, Xueping1 (AUTHOR), Liu, Wei1 (AUTHOR), Huang, Jiaoqi1 (AUTHOR), Tian, Huiyan1 (AUTHOR), Liu, Qiqian3 (AUTHOR), Huang, Guorong1 (AUTHOR), Gillibert, Raymond4 (AUTHOR), de la Chapelle, Marc Lamy5 (AUTHOR) Marc.lamydelachapelle@univ-lemans.fr, Fu, Weiling1 (AUTHOR) fwl@tmmu.edu.cn |
| Source: | Plasmonics. Jun2020, Vol. 15 Issue 3, p743-752. 10p. |
| Database: | Academic Search Ultimate |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 143328304 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Evaluation of the Reliability of Six Commercial SERS Substrates. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Liu%2C+Yu%22">Liu, Yu</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhang%2C+Yang%22">Zhang, Yang</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Tardivel%2C+Morgan%22">Tardivel, Morgan</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Lequeux%2C+Médéric%22">Lequeux, Médéric</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Chen%2C+Xueping%22">Chen, Xueping</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Liu%2C+Wei%22">Liu, Wei</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Huang%2C+Jiaoqi%22">Huang, Jiaoqi</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Tian%2C+Huiyan%22">Tian, Huiyan</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Liu%2C+Qiqian%22">Liu, Qiqian</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Huang%2C+Guorong%22">Huang, Guorong</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Gillibert%2C+Raymond%22">Gillibert, Raymond</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22de+la+Chapelle%2C+Marc+Lamy%22">de la Chapelle, Marc Lamy</searchLink><relatesTo>5</relatesTo> (AUTHOR)<i> Marc.lamydelachapelle@univ-lemans.fr</i><br /><searchLink fieldCode="AR" term="%22Fu%2C+Weiling%22">Fu, Weiling</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> fwl@tmmu.edu.cn</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Plasmonics%22">Plasmonics</searchLink>. Jun2020, Vol. 15 Issue 3, p743-752. 10p. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=143328304 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s11468-019-01084-8 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 10 StartPage: 743 Titles: – TitleFull: Evaluation of the Reliability of Six Commercial SERS Substrates. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Liu, Yu – PersonEntity: Name: NameFull: Zhang, Yang – PersonEntity: Name: NameFull: Tardivel, Morgan – PersonEntity: Name: NameFull: Lequeux, Médéric – PersonEntity: Name: NameFull: Chen, Xueping – PersonEntity: Name: NameFull: Liu, Wei – PersonEntity: Name: NameFull: Huang, Jiaoqi – PersonEntity: Name: NameFull: Tian, Huiyan – PersonEntity: Name: NameFull: Liu, Qiqian – PersonEntity: Name: NameFull: Huang, Guorong – PersonEntity: Name: NameFull: Gillibert, Raymond – PersonEntity: Name: NameFull: de la Chapelle, Marc Lamy – PersonEntity: Name: NameFull: Fu, Weiling IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 06 Text: Jun2020 Type: published Y: 2020 Identifiers: – Type: issn-print Value: 15571955 Numbering: – Type: volume Value: 15 – Type: issue Value: 3 Titles: – TitleFull: Plasmonics Type: main |
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