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Temperature-dependent infrared ellipsometry of Mo-doped VO2 thin films across the insulator to metal transition.

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Title: Temperature-dependent infrared ellipsometry of Mo-doped VO2 thin films across the insulator to metal transition.
Authors: Amador-Alvarado, S.1, Flores-Camacho, J. M.1, Solís-Zamudio, A.1, Castro-García, R.2, Pérez-Huerta, J. S.3, Antúnez-Cerón, E.4,5, Ortega-Gallegos, J.1, Madrigal-Melchor, J.3, Agarwal, V.6, Ariza-Flores, D.2 david.ariza@cactus.iico.uaslp.mx
Source: Scientific Reports. 5/22/2020, Vol. 10 Issue 1, p1-11. 11p.
Database: Academic Search Ultimate
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  Data: Temperature-dependent infrared ellipsometry of Mo-doped VO2 thin films across the insulator to metal transition.
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  Data: <searchLink fieldCode="JN" term="%22Scientific+Reports%22">Scientific Reports</searchLink>. 5/22/2020, Vol. 10 Issue 1, p1-11. 11p.
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