Bar, M., Bohne, W., Röhrich, J., Strub, F., Lindner, S., Lux-Steiner, M. C., . . . Karg, F. (2004). Determination of the band gap depth profile of the penternary Cu(In(1-X)GaX)(SYSe(1-Y))2 chalcopyrite from its composition gradient. Journal of Applied Physics, 96(7), 3857. https://doi.org/10.1063/1.1786340
Chicago Style (17th ed.) CitationBar, M., W. Bohne, J. Röhrich, F. Strub, S. Lindner, M. C. Lux-Steiner, Ch.-H Fischer, T. P. Niesen, and F. Karg. "Determination of the Band Gap Depth Profile of the Penternary Cu(In(1-X)GaX)(SYSe(1-Y))2 Chalcopyrite from Its Composition Gradient." Journal of Applied Physics 96, no. 7 (2004): 3857. https://doi.org/10.1063/1.1786340.
MLA (9th ed.) CitationBar, M., et al. "Determination of the Band Gap Depth Profile of the Penternary Cu(In(1-X)GaX)(SYSe(1-Y))2 Chalcopyrite from Its Composition Gradient." Journal of Applied Physics, vol. 96, no. 7, 2004, p. 3857, https://doi.org/10.1063/1.1786340.