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Determination of the band gap depth profile of the penternary Cu(In(1-X)GaX)(SYSe(1-Y))2 chalcopyrite from its composition gradient.

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Title: Determination of the band gap depth profile of the penternary Cu(In(1-X)GaX)(SYSe(1-Y))2 chalcopyrite from its composition gradient.
Authors: Bar, M.1 marcus.baer@hmi.de, Bohne, W.1, Röhrich, J.1, Strub, F.1, Lindner, S.1, Lux-Steiner, M. C.1, Fischer, Ch.-H.1, Niesen, T. P.2, Karg, F.2
Source: Journal of Applied Physics. 10/1/2004, Vol. 96 Issue 7, p3857-3860. 4p. 2 Charts, 3 Graphs.
Database: Academic Search Ultimate
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>. 10/1/2004, Vol. 96 Issue 7, p3857-3860. 4p. 2 Charts, 3 Graphs.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=14546523
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        Value: 10.1063/1.1786340
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        Text: English
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      – TitleFull: Determination of the band gap depth profile of the penternary Cu(In(1-X)GaX)(SYSe(1-Y))2 chalcopyrite from its composition gradient.
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              Text: 10/1/2004
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              Y: 2004
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