APA (7th ed.) Citation

Folomeshkin, M. S., Boikova, A. S., Volkovsky, Y. A., Marchenkova, M. A., Prosekov, P. A., & Seregin, A. Y. (2020). Refined Structure of Langmuir Lysozyme Films on Single-Crystal Silicon Wafers According to X-Ray Reflectivity Data. Crystallography Reports, 65(6), 827. https://doi.org/10.1134/S1063774520060152

Chicago Style (17th ed.) Citation

Folomeshkin, M. S., A. S. Boikova, Yu. A. Volkovsky, M. A. Marchenkova, P. A. Prosekov, and A. Yu Seregin. "Refined Structure of Langmuir Lysozyme Films on Single-Crystal Silicon Wafers According to X-Ray Reflectivity Data." Crystallography Reports 65, no. 6 (2020): 827. https://doi.org/10.1134/S1063774520060152.

MLA (9th ed.) Citation

Folomeshkin, M. S., et al. "Refined Structure of Langmuir Lysozyme Films on Single-Crystal Silicon Wafers According to X-Ray Reflectivity Data." Crystallography Reports, vol. 65, no. 6, 2020, p. 827, https://doi.org/10.1134/S1063774520060152.