Prediction of reflection amplitudes for ultrasonic inspection of rough planar defects.
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| Title: | Prediction of reflection amplitudes for ultrasonic inspection of rough planar defects. |
|---|---|
| Authors: | Haslinger, S. G.1,2, Lowe, M. J. S.1, Craster, R. V.1,3, Huthwaite, P.1, Shi, F.4 |
| Source: | Insight: Non-Destructive Testing & Condition Monitoring. Jan2021, Vol. 63 Issue 1, p28-36. 9p. |
| Database: | Academic Search Ultimate |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 148196416 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=148196416 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1784/insi.2021.63.1.28 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 9 StartPage: 28 Titles: – TitleFull: Prediction of reflection amplitudes for ultrasonic inspection of rough planar defects. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Haslinger, S. G. – PersonEntity: Name: NameFull: Lowe, M. J. S. – PersonEntity: Name: NameFull: Craster, R. V. – PersonEntity: Name: NameFull: Huthwaite, P. – PersonEntity: Name: NameFull: Shi, F. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: Jan2021 Type: published Y: 2021 Identifiers: – Type: issn-print Value: 13542575 Numbering: – Type: volume Value: 63 – Type: issue Value: 1 Titles: – TitleFull: Insight: Non-Destructive Testing & Condition Monitoring Type: main |
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