Klingel, V., Kirch, J., Ullrich, T., Weirich, S., Jeltsch, A., & Radde, N. E. (2021). Model‐based robustness and bistability analysis for methylation‐based, epigenetic memory systems. FEBS Journal, 288(19), 5692. https://doi.org/10.1111/febs.15838
Chicago Style (17th ed.) CitationKlingel, Viviane, Jakob Kirch, Timo Ullrich, Sara Weirich, Albert Jeltsch, and Nicole E. Radde. "Model‐based Robustness and Bistability Analysis for Methylation‐based, Epigenetic Memory Systems." FEBS Journal 288, no. 19 (2021): 5692. https://doi.org/10.1111/febs.15838.
MLA (9th ed.) CitationKlingel, Viviane, et al. "Model‐based Robustness and Bistability Analysis for Methylation‐based, Epigenetic Memory Systems." FEBS Journal, vol. 288, no. 19, 2021, p. 5692, https://doi.org/10.1111/febs.15838.