Farzand, M., Dhariwal, R., Hiebert, C. W., Spaner, D., & Randhawa, H. S. (2021). Mapping quantitative trait loci associated with stripe rust resistance from the Canadian wheat cultivar 'AAC Innova'. Canadian Journal of Plant Pathology, 43, S227. https://doi.org/10.1080/07060661.2021.1982011
Chicago Style (17th ed.) CitationFarzand, Momna, Raman Dhariwal, Colin W. Hiebert, Dean Spaner, and Harpinder S. Randhawa. "Mapping Quantitative Trait Loci Associated with Stripe Rust Resistance from the Canadian Wheat Cultivar 'AAC Innova'." Canadian Journal of Plant Pathology 43 (2021): S227. https://doi.org/10.1080/07060661.2021.1982011.
MLA (9th ed.) CitationFarzand, Momna, et al. "Mapping Quantitative Trait Loci Associated with Stripe Rust Resistance from the Canadian Wheat Cultivar 'AAC Innova'." Canadian Journal of Plant Pathology, vol. 43, 2021, p. S227, https://doi.org/10.1080/07060661.2021.1982011.