APA (7th ed.) Citation

Narita, T., Kanechika, M., Kojima, J., Watanabe, H., Kondo, T., Uesugi, T., . . . Suda, J. (2022). Identification of type of threading dislocation causing reverse leakage in GaN p–n junctions after continuous forward current stress. Scientific Reports, 12(1), 1. https://doi.org/10.1038/s41598-022-05416-3

Chicago Style (17th ed.) Citation

Narita, Tetsuo, et al. "Identification of Type of Threading Dislocation Causing Reverse Leakage in GaN P–n Junctions After Continuous Forward Current Stress." Scientific Reports 12, no. 1 (2022): 1. https://doi.org/10.1038/s41598-022-05416-3.

MLA (9th ed.) Citation

Narita, Tetsuo, et al. "Identification of Type of Threading Dislocation Causing Reverse Leakage in GaN P–n Junctions After Continuous Forward Current Stress." Scientific Reports, vol. 12, no. 1, 2022, p. 1, https://doi.org/10.1038/s41598-022-05416-3.