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Identification of type of threading dislocation causing reverse leakage in GaN p–n junctions after continuous forward current stress.

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Title: Identification of type of threading dislocation causing reverse leakage in GaN p–n junctions after continuous forward current stress.
Authors: Narita, Tetsuo1 (AUTHOR) tetsuo-narita@mosk.tytlabs.co.jp, Kanechika, Masakazu2 (AUTHOR), Kojima, Jun2 (AUTHOR), Watanabe, Hiroki3 (AUTHOR), Kondo, Takeshi2 (AUTHOR), Uesugi, Tsutomu2 (AUTHOR), Yamaguchi, Satoshi1 (AUTHOR), Kimoto, Yasuji1 (AUTHOR), Tomita, Kazuyoshi2 (AUTHOR), Nagasato, Yoshitaka3 (AUTHOR), Ikeda, Satoshi3 (AUTHOR), Kosaki, Masayoshi4 (AUTHOR), Oka, Tohru4 (AUTHOR), Suda, Jun2,5 (AUTHOR)
Source: Scientific Reports. 1/27/2022, Vol. 12 Issue 1, p1-7. 7p.
Database: Academic Search Ultimate
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Description
ISSN:20452322
DOI:10.1038/s41598-022-05416-3