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Identification of type of threading dislocation causing reverse leakage in GaN p–n junctions after continuous forward current stress.

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Title: Identification of type of threading dislocation causing reverse leakage in GaN p–n junctions after continuous forward current stress.
Authors: Narita, Tetsuo1 (AUTHOR) tetsuo-narita@mosk.tytlabs.co.jp, Kanechika, Masakazu2 (AUTHOR), Kojima, Jun2 (AUTHOR), Watanabe, Hiroki3 (AUTHOR), Kondo, Takeshi2 (AUTHOR), Uesugi, Tsutomu2 (AUTHOR), Yamaguchi, Satoshi1 (AUTHOR), Kimoto, Yasuji1 (AUTHOR), Tomita, Kazuyoshi2 (AUTHOR), Nagasato, Yoshitaka3 (AUTHOR), Ikeda, Satoshi3 (AUTHOR), Kosaki, Masayoshi4 (AUTHOR), Oka, Tohru4 (AUTHOR), Suda, Jun2,5 (AUTHOR)
Source: Scientific Reports. 1/27/2022, Vol. 12 Issue 1, p1-7. 7p.
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  Data: Identification of type of threading dislocation causing reverse leakage in GaN p–n junctions after continuous forward current stress.
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  Data: <searchLink fieldCode="JN" term="%22Scientific+Reports%22">Scientific Reports</searchLink>. 1/27/2022, Vol. 12 Issue 1, p1-7. 7p.
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        Value: 10.1038/s41598-022-05416-3
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