Identification of type of threading dislocation causing reverse leakage in GaN p–n junctions after continuous forward current stress. - Narita, Tetsuo; Kanechika, Masakazu; Kojima, Jun; Watanabe, Hiroki; Kondo, Takeshi; Uesugi, Tsutomu; Yamaguchi, Satoshi; Kimoto, Yasuji; Tomita, Kazuyoshi; Nagasato, Yoshitaka; Ikeda, Satoshi; Kosaki, Masayoshi; et al. (Scientific Reports, 2022)