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Film Thickness Determination by SEM-EDX Measurements of the Attenuation of X-Rays Generated in a Specially Designed Target.

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Title: Film Thickness Determination by SEM-EDX Measurements of the Attenuation of X-Rays Generated in a Specially Designed Target.
Alternate Title: Determinación del Espesor de Películas mediante Mediciones con SEM-EDX de la Atenuación de Rayos-X Generados en un Blanco Especialmente Diseñado.
Authors: Rojas, C. E.1 carlosrojas1@gmail.com, Rodríguez, G.2
Source: Acta Microscopica. 2022, Vol. 31 Issue 1, p33-38. 6p.
Database: Academic Search Ultimate
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  Data: Film Thickness Determination by SEM-EDX Measurements of the Attenuation of X-Rays Generated in a Specially Designed Target.
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  Data: Determinación del Espesor de Películas mediante Mediciones con SEM-EDX de la Atenuación de Rayos-X Generados en un Blanco Especialmente Diseñado.
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  Data: <searchLink fieldCode="AR" term="%22Rojas%2C+C%2E+E%2E%22">Rojas, C. E.</searchLink><relatesTo>1</relatesTo><i> carlosrojas1@gmail.com</i><br /><searchLink fieldCode="AR" term="%22Rodríguez%2C+G%2E%22">Rodríguez, G.</searchLink><relatesTo>2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Acta+Microscopica%22">Acta Microscopica</searchLink>. 2022, Vol. 31 Issue 1, p33-38. 6p.
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        Text: English
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      – TitleFull: Film Thickness Determination by SEM-EDX Measurements of the Attenuation of X-Rays Generated in a Specially Designed Target.
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              Text: 2022
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