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X-ray Diffraction Analysis of the Structure In0.53Ga0.47As Films Grown on (100) and (111)A GaAs Substrates with a Metamorphic Buffer.

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Title: X-ray Diffraction Analysis of the Structure In0.53Ga0.47As Films Grown on (100) and (111)A GaAs Substrates with a Metamorphic Buffer.
Authors: Folomeshkin, M. S.1,2 (AUTHOR) folmaxim@gmail.com, Volkovsky, Yu. A.1,2 (AUTHOR), Prosekov, P. A.1,2 (AUTHOR), Galiev, G. B.3 (AUTHOR), Klimov, E. A.3 (AUTHOR), Klochkov, A. N.3 (AUTHOR), Pushkarev, S. S.3 (AUTHOR), Seregin, A. Yu.1,2 (AUTHOR), Pisarevsky, Yu. V.1,2 (AUTHOR), Blagov, A. E.1,2 (AUTHOR), Kovalchuk, M. V.1,2,4 (AUTHOR)
Source: Crystallography Reports. Jun2022, Vol. 67 Issue 3, p317-322. 6p.
Database: Academic Search Ultimate
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ISSN:10637745
DOI:10.1134/S1063774522030075