X-ray Diffraction Analysis of the Structure In0.53Ga0.47As Films Grown on (100) and (111)A GaAs Substrates with a Metamorphic Buffer. - Folomeshkin, M. S.; Volkovsky, Yu. A.; Prosekov, P. A.; Galiev, G. B.; Klimov, E. A.; Klochkov, A. N.; Pushkarev, S. S.; Seregin, A. Yu.; Pisarevsky, Yu. V.; Blagov, A. E.; Kovalchuk, M. V. (Crystallography Reports, 2022)