SiC‐based analytical model for gate‐stack dual metal nanowire FET with enhanced analog performance.

Saved in:
Bibliographic Details
Title: SiC‐based analytical model for gate‐stack dual metal nanowire FET with enhanced analog performance.
Authors: Neeraj1 (AUTHOR), Goel, Anubha2 (AUTHOR), Sharma, Shobha1 (AUTHOR), Rewari, Sonam3 (AUTHOR) rewarisonam@gmail.com, Gupta, Radhey Shyam2 (AUTHOR)
Source: International Journal of Numerical Modelling. Jul2022, Vol. 35 Issue 4, p1-15. 15p.
Database: Academic Search Ultimate
Full text is not displayed to guests.
FullText Links:
  – Type: pdflink
Text:
  Availability: 1
Header DbId: asn
DbLabel: Academic Search Ultimate
An: 157331434
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: SiC‐based analytical model for gate‐stack dual metal nanowire FET with enhanced analog performance.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Neeraj%22">Neeraj</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Goel%2C+Anubha%22">Goel, Anubha</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Sharma%2C+Shobha%22">Sharma, Shobha</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Rewari%2C+Sonam%22">Rewari, Sonam</searchLink><relatesTo>3</relatesTo> (AUTHOR)<i> rewarisonam@gmail.com</i><br /><searchLink fieldCode="AR" term="%22Gupta%2C+Radhey+Shyam%22">Gupta, Radhey Shyam</searchLink><relatesTo>2</relatesTo> (AUTHOR)
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Numerical+Modelling%22">International Journal of Numerical Modelling</searchLink>. Jul2022, Vol. 35 Issue 4, p1-15. 15p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=157331434
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1002/jnm.2986
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 15
        StartPage: 1
    Titles:
      – TitleFull: SiC‐based analytical model for gate‐stack dual metal nanowire FET with enhanced analog performance.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Neeraj
      – PersonEntity:
          Name:
            NameFull: Goel, Anubha
      – PersonEntity:
          Name:
            NameFull: Sharma, Shobha
      – PersonEntity:
          Name:
            NameFull: Rewari, Sonam
      – PersonEntity:
          Name:
            NameFull: Gupta, Radhey Shyam
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 07
              Text: Jul2022
              Type: published
              Y: 2022
          Identifiers:
            – Type: issn-print
              Value: 08943370
          Numbering:
            – Type: volume
              Value: 35
            – Type: issue
              Value: 4
          Titles:
            – TitleFull: International Journal of Numerical Modelling
              Type: main
ResultId 1