APA (7th ed.) Citation

Heringhaus, M. E., Zhang, Y., Zimmermann, A., & Mikelsons, L. (2022). Towards Reliable Parameter Extraction in MEMS Final Module Testing Using Bayesian Inference. Sensors (14248220), 22(14), N.PAG. https://doi.org/10.3390/s22145408

Chicago Style (17th ed.) Citation

Heringhaus, Monika E., Yi Zhang, André Zimmermann, and Lars Mikelsons. "Towards Reliable Parameter Extraction in MEMS Final Module Testing Using Bayesian Inference." Sensors (14248220) 22, no. 14 (2022): N.PAG. https://doi.org/10.3390/s22145408.

MLA (9th ed.) Citation

Heringhaus, Monika E., et al. "Towards Reliable Parameter Extraction in MEMS Final Module Testing Using Bayesian Inference." Sensors (14248220), vol. 22, no. 14, 2022, p. N.PAG, https://doi.org/10.3390/s22145408.