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Towards Reliable Parameter Extraction in MEMS Final Module Testing Using Bayesian Inference.

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Title: Towards Reliable Parameter Extraction in MEMS Final Module Testing Using Bayesian Inference.
Authors: Heringhaus, Monika E.1,2 (AUTHOR) monika.heringhaus@de.bosch.com, Zhang, Yi3 (AUTHOR) lars.mikelsons@uni-a.de, Zimmermann, André2,4 (AUTHOR), Mikelsons, Lars3 (AUTHOR)
Source: Sensors (14248220). Jul2022, Vol. 22 Issue 14, pN.PAG-N.PAG. 22p.
Database: Academic Search Ultimate
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  Data: <searchLink fieldCode="JN" term="%22Sensors+%2814248220%29%22">Sensors (14248220)</searchLink>. Jul2022, Vol. 22 Issue 14, pN.PAG-N.PAG. 22p.
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