Towards Reliable Parameter Extraction in MEMS Final Module Testing Using Bayesian Inference.
Saved in:
| Title: | Towards Reliable Parameter Extraction in MEMS Final Module Testing Using Bayesian Inference. |
|---|---|
| Authors: | Heringhaus, Monika E.1,2 (AUTHOR) monika.heringhaus@de.bosch.com, Zhang, Yi3 (AUTHOR) lars.mikelsons@uni-a.de, Zimmermann, André2,4 (AUTHOR), Mikelsons, Lars3 (AUTHOR) |
| Source: | Sensors (14248220). Jul2022, Vol. 22 Issue 14, pN.PAG-N.PAG. 22p. |
| Database: | Academic Search Ultimate |
|
Full text is not displayed to guests.
Login for full access.
|
|
Be the first to leave a comment!
