APA (7th ed.) Citation

Cheng, Y., Luo, Y., Shen, R., Kong, D., & Zhou, W. (2023). Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device. Materials (1996-1944), 16(2), 681. https://doi.org/10.3390/ma16020681

Chicago Style (17th ed.) Citation

Cheng, Yuan, Yaozhi Luo, Ruihong Shen, Deyu Kong, and Weiyong Zhou. "Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device." Materials (1996-1944) 16, no. 2 (2023): 681. https://doi.org/10.3390/ma16020681.

MLA (9th ed.) Citation

Cheng, Yuan, et al. "Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device." Materials (1996-1944), vol. 16, no. 2, 2023, p. 681, https://doi.org/10.3390/ma16020681.