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Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device.

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Title: Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device.
Authors: Cheng, Yuan1,2 (AUTHOR), Luo, Yaozhi1 (AUTHOR), Shen, Ruihong1,2 (AUTHOR) srh_1023@163.com, Kong, Deyu3 (AUTHOR) srh_1023@163.com, Zhou, Weiyong4 (AUTHOR)
Source: Materials (1996-1944). Jan2023, Vol. 16 Issue 2, p681. 9p.
Database: Academic Search Ultimate
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  Data: Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device.
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  Data: <searchLink fieldCode="JN" term="%22Materials+%281996-1944%29%22">Materials (1996-1944)</searchLink>. Jan2023, Vol. 16 Issue 2, p681. 9p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=161477737
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        Value: 10.3390/ma16020681
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        Text: English
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      – TitleFull: Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device.
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            NameFull: Cheng, Yuan
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              Text: Jan2023
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              Y: 2023
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