Bondarenko, V., Krause-Rehberg, R., Feick, H., & Davia, C. (2004). Defects in FZ-silicon after neutron irradiation—A positron annihilation and photoluminescence study. Journal of Materials Science, 39(3), 919. https://doi.org/10.1023/B:JMSC.0000012922.58713.37
Chicago Style (17th ed.) CitationBondarenko, V., R. Krause-Rehberg, H. Feick, and C. Davia. "Defects in FZ-silicon After Neutron Irradiation—A Positron Annihilation and Photoluminescence Study." Journal of Materials Science 39, no. 3 (2004): 919. https://doi.org/10.1023/B:JMSC.0000012922.58713.37.
MLA (9th ed.) CitationBondarenko, V., et al. "Defects in FZ-silicon After Neutron Irradiation—A Positron Annihilation and Photoluminescence Study." Journal of Materials Science, vol. 39, no. 3, 2004, p. 919, https://doi.org/10.1023/B:JMSC.0000012922.58713.37.