APA (7th ed.) Citation

Chen, J., Wang, B., Chen, X., Jiang, Q., Feng, W., Xu, Z., & Zhao, Z. (2023). A Micro-Topography Measurement and Compensation Method for the Key Component Surface Based on White-Light Interferometry. Sensors (14248220), 23(19), 8307. https://doi.org/10.3390/s23198307

Chicago Style (17th ed.) Citation

Chen, Junying, Boxuan Wang, Xiuyu Chen, Qingshan Jiang, Wei Feng, Zhilong Xu, and Zhenye Zhao. "A Micro-Topography Measurement and Compensation Method for the Key Component Surface Based on White-Light Interferometry." Sensors (14248220) 23, no. 19 (2023): 8307. https://doi.org/10.3390/s23198307.

MLA (9th ed.) Citation

Chen, Junying, et al. "A Micro-Topography Measurement and Compensation Method for the Key Component Surface Based on White-Light Interferometry." Sensors (14248220), vol. 23, no. 19, 2023, p. 8307, https://doi.org/10.3390/s23198307.