A Micro-Topography Measurement and Compensation Method for the Key Component Surface Based on White-Light Interferometry.
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| Title: | A Micro-Topography Measurement and Compensation Method for the Key Component Surface Based on White-Light Interferometry. |
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| Authors: | Chen, Junying1 (AUTHOR) chenjunying@jmu.edu.cn, Wang, Boxuan1 (AUTHOR), Chen, Xiuyu1 (AUTHOR), Jiang, Qingshan1 (AUTHOR) 15392169726@163.com, Feng, Wei1 (AUTHOR), Xu, Zhilong1 (AUTHOR), Zhao, Zhenye1 (AUTHOR) |
| Source: | Sensors (14248220). Oct2023, Vol. 23 Issue 19, p8307. 15p. |
| Database: | Academic Search Ultimate |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 172987445 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: A Micro-Topography Measurement and Compensation Method for the Key Component Surface Based on White-Light Interferometry. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Chen%2C+Junying%22">Chen, Junying</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> chenjunying@jmu.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Wang%2C+Boxuan%22">Wang, Boxuan</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Chen%2C+Xiuyu%22">Chen, Xiuyu</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Jiang%2C+Qingshan%22">Jiang, Qingshan</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> 15392169726@163.com</i><br /><searchLink fieldCode="AR" term="%22Feng%2C+Wei%22">Feng, Wei</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Xu%2C+Zhilong%22">Xu, Zhilong</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhao%2C+Zhenye%22">Zhao, Zhenye</searchLink><relatesTo>1</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Sensors+%2814248220%29%22">Sensors (14248220)</searchLink>. Oct2023, Vol. 23 Issue 19, p8307. 15p. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=172987445 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.3390/s23198307 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 15 StartPage: 8307 Titles: – TitleFull: A Micro-Topography Measurement and Compensation Method for the Key Component Surface Based on White-Light Interferometry. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Chen, Junying – PersonEntity: Name: NameFull: Wang, Boxuan – PersonEntity: Name: NameFull: Chen, Xiuyu – PersonEntity: Name: NameFull: Jiang, Qingshan – PersonEntity: Name: NameFull: Feng, Wei – PersonEntity: Name: NameFull: Xu, Zhilong – PersonEntity: Name: NameFull: Zhao, Zhenye IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 10 Text: Oct2023 Type: published Y: 2023 Identifiers: – Type: issn-print Value: 14248220 Numbering: – Type: volume Value: 23 – Type: issue Value: 19 Titles: – TitleFull: Sensors (14248220) Type: main |
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