Goodness-of-fit tests for the Weibull distribution based on the Laplace transform and Stein's method.

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Bibliographic Details
Title: Goodness-of-fit tests for the Weibull distribution based on the Laplace transform and Stein's method.
Authors: Ebner, Bruno1 (AUTHOR) Bruno.Ebner@kit.edu, Fischer, Adrian2 (AUTHOR), Henze, Norbert1 (AUTHOR), Mayer, Celeste3 (AUTHOR)
Source: Annals of the Institute of Statistical Mathematics. Dec2023, Vol. 75 Issue 6, p1011-1038. 28p.
Database: Academic Search Ultimate
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Description
ISSN:00203157
DOI:10.1007/s10463-023-00873-7