APA (7th ed.) Citation

Ma, X., Xiong, R., Wang, W., & Zhang, X. (2023). Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy. Sensors (14248220), 23(23), 9526. https://doi.org/10.3390/s23239526

Chicago Style (17th ed.) Citation

Ma, Xinyang, Rui Xiong, Wei Wang, and Xiangchao Zhang. "Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy." Sensors (14248220) 23, no. 23 (2023): 9526. https://doi.org/10.3390/s23239526.

MLA (9th ed.) Citation

Ma, Xinyang, et al. "Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy." Sensors (14248220), vol. 23, no. 23, 2023, p. 9526, https://doi.org/10.3390/s23239526.