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Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy.

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Title: Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy.
Authors: Ma, Xinyang1 (AUTHOR), Xiong, Rui1 (AUTHOR), Wang, Wei1,2 (AUTHOR) wei_w11@fudan.edu.cn, Zhang, Xiangchao1,3 (AUTHOR) wei_w11@fudan.edu.cn
Source: Sensors (14248220). Dec2023, Vol. 23 Issue 23, p9526. 13p.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 174113137
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Ma%2C+Xinyang%22">Ma, Xinyang</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Xiong%2C+Rui%22">Xiong, Rui</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Wang%2C+Wei%22">Wang, Wei</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> wei_w11@fudan.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Zhang%2C+Xiangchao%22">Zhang, Xiangchao</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<i> wei_w11@fudan.edu.cn</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Sensors+%2814248220%29%22">Sensors (14248220)</searchLink>. Dec2023, Vol. 23 Issue 23, p9526. 13p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=174113137
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.3390/s23239526
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 13
        StartPage: 9526
    Titles:
      – TitleFull: Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Ma, Xinyang
      – PersonEntity:
          Name:
            NameFull: Xiong, Rui
      – PersonEntity:
          Name:
            NameFull: Wang, Wei
      – PersonEntity:
          Name:
            NameFull: Zhang, Xiangchao
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 12
              Text: Dec2023
              Type: published
              Y: 2023
          Identifiers:
            – Type: issn-print
              Value: 14248220
          Numbering:
            – Type: volume
              Value: 23
            – Type: issue
              Value: 23
          Titles:
            – TitleFull: Sensors (14248220)
              Type: main
ResultId 1