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Reliable ferroelectricity in sol–gel‐derived BiFeO3 thin films below 200 nm.

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Bibliographic Details
Title: Reliable ferroelectricity in sol–gel‐derived BiFeO3 thin films below 200 nm.
Authors: Gao, Xuan1 (AUTHOR), Dai, Le1 (AUTHOR), Liu, Yang1 (AUTHOR), Wang, Ke2 (AUTHOR), Karpinsky, D. V.3 (AUTHOR), Liu, Lisha1 (AUTHOR) lishaliu@njust.edu.cn, Wang, Yaojin1 (AUTHOR) yjwang@njust.edu.cn
Source: Journal of the American Ceramic Society. May2024, Vol. 107 Issue 5, p3301-3312. 12p.
Database: Academic Search Ultimate
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ISSN:00027820
DOI:10.1111/jace.19639