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Monte Carlo study of noise scaling in AlGaN / GaN HFETs.

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Title: Monte Carlo study of noise scaling in AlGaN / GaN HFETs.
Authors: Madhusudan Singh1, Yuh-Renn Wu1, Palacios, Tomas2, Singh, Jasprit1, Mishra, Umesh2
Source: AIP Conference Proceedings. 2005, Vol. 772 Issue 1, p441-442. 2p.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 17804505
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 0
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  Data: Monte Carlo study of noise scaling in AlGaN / GaN HFETs.
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  Data: <searchLink fieldCode="JN" term="%22AIP+Conference+Proceedings%22">AIP Conference Proceedings</searchLink>. 2005, Vol. 772 Issue 1, p441-442. 2p.
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1063/1.1994173
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      – Code: eng
        Text: English
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        PageCount: 2
        StartPage: 441
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      – TitleFull: Monte Carlo study of noise scaling in AlGaN / GaN HFETs.
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            NameFull: Madhusudan Singh
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            NameFull: Yuh-Renn Wu
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            NameFull: Palacios, Tomas
      – PersonEntity:
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            NameFull: Singh, Jasprit
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            NameFull: Mishra, Umesh
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              Text: 2005
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              Value: 772
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            – TitleFull: AIP Conference Proceedings
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