View in EDS

Monte Carlo study of noise scaling in AlGaN / GaN HFETs.

Saved in:

Bibliographic Details
Title:	Monte Carlo study of noise scaling in AlGaN / GaN HFETs.
Authors:	Madhusudan Singh¹, Yuh-Renn Wu¹, Palacios, Tomas², Singh, Jasprit¹, Mishra, Umesh²
Source:	AIP Conference Proceedings. 2005, Vol. 772 Issue 1, p441-442. 2p.
Database:	Academic Search Ultimate

Description
ISSN:	0094243X
DOI:	10.1063/1.1994173