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Monte Carlo study of noise scaling in AlGaN / GaN HFETs.

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Bibliographic Details
Title: Monte Carlo study of noise scaling in AlGaN / GaN HFETs.
Authors: Madhusudan Singh1, Yuh-Renn Wu1, Palacios, Tomas2, Singh, Jasprit1, Mishra, Umesh2
Source: AIP Conference Proceedings. 2005, Vol. 772 Issue 1, p441-442. 2p.
Database: Academic Search Ultimate
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