Dallmann, J., Graetz, J., & Hock, R. (2024). Universal simulation of absorption effects for X‐ray diffraction in reflection geometry. Acta Crystallographica. Section A, Foundations & Advances, 80(4), 315. https://doi.org/10.1107/S2053273324003292
Chicago Style (17th ed.) CitationDallmann, Johannes, Jonas Graetz, and Rainer Hock. "Universal Simulation of Absorption Effects for X‐ray Diffraction in Reflection Geometry." Acta Crystallographica. Section A, Foundations & Advances 80, no. 4 (2024): 315. https://doi.org/10.1107/S2053273324003292.
MLA (9th ed.) CitationDallmann, Johannes, et al. "Universal Simulation of Absorption Effects for X‐ray Diffraction in Reflection Geometry." Acta Crystallographica. Section A, Foundations & Advances, vol. 80, no. 4, 2024, p. 315, https://doi.org/10.1107/S2053273324003292.