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Polarized Raman mapping and phase-transition by CW excitation for fast purely optical characterization of VO2 thin films.

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Bibliographic Details
Title: Polarized Raman mapping and phase-transition by CW excitation for fast purely optical characterization of VO2 thin films.
Authors: Mussi, V.1 valentina.mussi@cnr.it, Bovino, F. A.2, Falsini, R.2, Daloiso, D.2, Lupo, F. V.3, Kunjumon, R.2, Voti, R. Li2, Cesca, T.4, Macaluso, R.3, Sibilia, C.2, Mattei, G.4
Source: Scientific Reports. 8/20/2024, Vol. 14 Issue 1, p1-9. 9p.
Database: Academic Search Ultimate
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ISSN:20452322
DOI:10.1038/s41598-024-70301-0