Polarized Raman mapping and phase-transition by CW excitation for fast purely optical characterization of VO2 thin films. - Mussi, V.; Bovino, F. A.; Falsini, R.; Daloiso, D.; Lupo, F. V.; Kunjumon, R.; Voti, R. Li; Cesca, T.; Macaluso, R.; Sibilia, C.; Mattei, G. (Scientific Reports, 2024)