Song, W., Yang, X., Deng, W., Cattani, P., & Villecco, F. (2024). Remaining Useful Life Prediction for Power Storage Electronic Components Based on Fractional Weibull Process and Shock Poisson Model. Fractal & Fractional, 8(8), 485. https://doi.org/10.3390/fractalfract8080485
Chicago Style (17th ed.) CitationSong, Wanqing, Xianhua Yang, Wujin Deng, Piercarlo Cattani, and Francesco Villecco. "Remaining Useful Life Prediction for Power Storage Electronic Components Based on Fractional Weibull Process and Shock Poisson Model." Fractal & Fractional 8, no. 8 (2024): 485. https://doi.org/10.3390/fractalfract8080485.
MLA (9th ed.) CitationSong, Wanqing, et al. "Remaining Useful Life Prediction for Power Storage Electronic Components Based on Fractional Weibull Process and Shock Poisson Model." Fractal & Fractional, vol. 8, no. 8, 2024, p. 485, https://doi.org/10.3390/fractalfract8080485.