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Remaining Useful Life Prediction for Power Storage Electronic Components Based on Fractional Weibull Process and Shock Poisson Model.

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Title: Remaining Useful Life Prediction for Power Storage Electronic Components Based on Fractional Weibull Process and Shock Poisson Model.
Authors: Song, Wanqing1 (AUTHOR) swqls@126.com, Yang, Xianhua1 (AUTHOR) 18059214837@163.com, Deng, Wujin2 (AUTHOR) dwj058@126.com, Cattani, Piercarlo3 (AUTHOR) cattani.1642354@studenti.uniroma1.it, Villecco, Francesco4 (AUTHOR) fvillecc@unisa.it
Source: Fractal & Fractional. Aug2024, Vol. 8 Issue 8, p485. 18p.
Database: Academic Search Ultimate
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ISSN:25043110
DOI:10.3390/fractalfract8080485